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Editorial

Welcome to a New Year of ID
By Stephen P. Atwood

Industry News

Yesterday's Lessons Inform the Decisions of Today and Tomorrow

The Business of Displays

Yesterday's Lessons Inform the Decisions of Today and Tomorrow
By Elliott Schlam

Short Subjects

NIST Launches New Short Course in Display Metrology
By Edward F. Kelley

A Closer Look at FPD Measurement Standards and Trends

The VESA FPDM standard is widely recognized as the best display-measurement standard. However, there are several less-popular standards and specifications that are also being used.
By Phil Downen

Optics, Illumination, and Processing Tradeoffs for Display Inspection

If the optics for a display-inspection system is reasonably well chosen, near-optimal performance can be obtained with the correct choice of illumination and processing, regardless of the relative characteristics of the optical components.
By Lewis Collier

Otto Schade - A Pioneer with an Insight into Image Quality

As SID prepares to award the first Otto Schade Prize for Display Performance and Image Quality, meet the man after whom the prize is named.
By The Editorial Staff

Ingenuity Sets the Tone at EuroDisplay '05

Emerging technologies enjoyed the spotlight at EuroDisplay 2005, where innovations in 3-D technology, OLEDs, plasma displays, and projection systems were just a few of the notable presentations.
By Ken Werner

Journal of the SID Preview

The papers appearing in the January 2006 issue of the Journal of the SID are previewed.
By Aris Silzars

SID News

January 2006 22 01 Display-Metrology Issue cover_0106_small.jpgcover_0106_smaller.jpg cover_0106_large.jpgWelcome to a New Year of ID